PCB Assembly Testing Solutions by Kyoritsu Test System, Japan

In-circuit Tester is a successful method for electrically testing PCB assemblies once they have passed through a
soldering process and visual inspection. The limited access to the circuit nodes in densely populated PCBs with tiny
components seriously challenges traditional PCBA testing strategies. ICT is able to detect manufacturing defects
including track open/short problems, component missing, mis-orientation, wrong component placement, IC pin
floating, etc.
In order to detect these defects efficiently and with a lowest number of DUT failure instances, it is necessary for the
board or assembly to have undergone a design for testing process mostly know as DFT. In order to ensure that the
ICT test can be performed efficiently a number of guidelines can be followed in the design and layout of the printed
circuit board. The key to effective in-circuit test is to ‘plan ahead’, beginning right at the design stage. Test engineers
and design engineers must work together. Designers must recognize the benefits of direct electrical access to as many
test points as possible. Test engineers must recognize that to be economical, a product cannot have significant
portions of PCB real area available for test-probe access. Compromising on these guidelines is critical and it can lead
from the straightforward approach to the complex situation. As a straightforward approach, designers might choose to
bury relatively reliable parts, such as passive devices, while preserving direct electrical access to more fragile parts,
such as dense mixed-signal systems-on-chips (SOCs). This will make the ICT more effective and less likely indicate
problems that do not exist. By implementing these design for test features, testing can be made more effective and
this will result in swifter testing, less rework, wide test coverage and overall reduced production costs.
Kyoritsu In-Circuit Testers
FOCUS 2000 : In-Circuit Tester
FOCUS 4000 : Combination Tester (ICT + Function)
Kyoritsu Test Systems, Japan is pioneer in In-circuit Testing machines and have been offering it’s FOCUS series
ICTs worldwide since 2001, which are built-in with patented ‘Advance Ultra High Speed Solid State
Switching Technology’
FOCUS ICTs ensures PCBA tests are done at high speed maintaining consistent, stable & accurate test results. These
Kyoritsu ICTs provide wider measurement range for all passive & active semiconductors components with very good
repeatability. FOCUS ICT can evaluate individual component missing, misaligned, or misplaced and can make
judgements about the integrity of the solder joints, whereas FOCUS Functional testers can exercise and grade the
performance of a board by simulating the electrical environment it will face in the target product, when put to
The exclusive Auto Guarding feature allows for accurately testing of the value of the component by avoiding all
leakage paths around the component under test.
On larger boards the node count can easily rise over a thousand and may reach several thousand on some. To have
dedicated pins on the tester for each node can be very costly as each one requires its own driver sensor. To reduce this
cost FOCUS series tester comes with multiplexing feature. This multiplexing feature allows FOCUS series tester to
supports 16000 test nodes.
System Software used by FOCUS Series tester
FOCUS 2000 test software is used for MDA level testing whereas FOCUS 2220 test software is used for ICT level
testing. For Focus 4000 Tester (ICT + Function test), 2 software namely FOCUS 2220 and FX-BUILDER are used in
This system software is highly user friendly.
Typical Test sequence of FOCUS ICTs is as follows:
1. Discharging capacitors, especially electrolytic capacitors (for safety and measurement stability, this test
sequence must be done first before testing any other items)
2. Contact Test (To verify the test system is connected to the Unit Under Test (UUT)
3. Shorts testing (Test for solder shorts and opens)
4. Analog tests (Test all components for placement and correct value)
5. Test for capacitor, diodes, transistors & ICs orientation defects
6. Power up UUT
7. Discharging capacitors as UUT is powered down
FOCUS series tester allows you to add additional hardware to the test fixture to allow different solutions to be
implemented. Such additional hardware includes:
 JTAG Boundary scan tests
 Flash Memory, EEPROM, and other device programming
 Photo-detectors to test for LED colour and intensity
 External timer counter modules to test very high frequencies (over 50 MHz) crystals and
 Signal waveform analysis, e.g. slew rate measurement, envelope curve etc.
 External equipment can be used for hi-voltage measurement (more than 100Vdc due to
limitation of voltage that is provided) or AC / DC equipment Source those have interface to
PC as the ICT Controller
Standalone Function Modules- Customer can opt for function modules from a wide range of Kyoritsu’s ‘FXSeries
Modules’. These can be used as standalone as well can be integrated with the ATEs.
 DMM – Digital Multi Meter
 WFT – Wave Form Tester (Digital Oscilloscope)
 Logic Analyser
 Frequency / Pulse Generator
 Frequency Counter
 Relay Modules
 Insulation Tester
 LED Analyser (Colour & Intensity)
If you are looking to buy In-Circuit Tester KYORITSU is the right choice for you!!
Please give us a call at:
+91 9552597468
Mackmilan – ICT Engineer (Kyoritsu Electric India)